3x Improved Set-voltage Variability of Cu Atom Switch with Split-electrode for Very Large Scale Integration

N. Banno

doi:https://doi.org/10.7567/SSDM.2019.H-1-02

2:30 PM - 2:45 PM

[H-1-02] 3x Improved Set-voltage Variability of Cu Atom Switch with Split-electrode for Very Large Scale Integration

^○N. Banno¹, K. Okamoto¹, H. Numata¹, N. Iguchi¹, M. Miyamura¹, R. Nebashi¹, X. Bai¹, H. Hada¹, T. Sugibayashi¹, T. Sakamoto¹, M. Tada¹ (1.NEC Corp. (Japan))

https://doi.org/10.7567/SSDM.2019.H-1-02

2019 International Conference on Solid State Devices and Materials

[H-1-02] 3x Improved Set-voltage Variability of Cu Atom Switch with Split-electrode for Very Large Scale Integration