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[K-3-04] Analysis of Oscillatory Phenomena in Cathode Designs for 1200 V Diodes Using an LCR Circuit Model in Reverse Recovery

^○K. Fuse¹, K. Kawamura¹, T. Matsudai¹, W. Saito¹ (1.Toshiba Electronic Devices & Storage Corp. (Japan))

https://doi.org/10.7567/SSDM.2019.K-3-04