Quantification of Insulator and Semiconductor Carrier Trapping in Organic Thin Film Transistors Using DNTT and TU-1

Kunihiro Oshima

doi:https://doi.org/10.7567/SSDM.2020.G-5-02

2:30 PM - 2:45 PM

[G-5-02] Quantification of Insulator and Semiconductor Carrier Trapping in Organic Thin Film Transistors Using DNTT and TU-1

〇Kunihiro Oshima¹, Kazunori Kuribara², Song Bian¹, Takashi Sato¹ (1. Kyoto Univ.(Japan), 2. National Inst. of Advanced Indus. Sci. and Technol. (AIST)(Japan))

https://doi.org/10.7567/SSDM.2020.G-5-02

2020 International Conference on Solid State Devices and Materials

[G-5-02] Quantification of Insulator and Semiconductor Carrier Trapping in Organic Thin Film Transistors Using DNTT and TU-1