1:30 PM - 2:00 PM

[J-9-01 (Invited)] Non-destructive Breakdown in GaN/SiC-based Hybrid HEMT

〇Akira Nakajima¹, Hirohisa Hirai¹, Yoshinao Miura¹, Shinsuke Harada¹ (1. AIST (Japan))

Presentation style: On-site (in-person)

https://doi.org/10.7567/SSDM.2022.J-9-01