Oral Presentation

12: Advanced Circuits / Systems Interacting with Innovative Devices and Materials

[J-4] Circuit Reliability and Image Sensors

2023年9月7日(木) 10:45 〜 12:00 Room J (233, Bldg. 2)

Session Chairs: Takeshi Yoshida (Hiroshima Univ.), Keita Yasutomi (Shizuoka Univ.)

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10:45 〜 11:15

[J-4-01 (Invited)] Circuit-level Insight into Reliability Issues of Si-based Semiconductor Chips

^○Kazutoshi Kobayashi¹ (1. Kyoto Inst. of Tech. (Japan))

11:15 〜 11:30

[J-4-02] Total Ionizing Dose Effect by Gamma-ray Irradiation and Recovery Phenomenon by Applying High Gate Bias to Commercial SiC Power MOSFETs

^○Masatoshi Mizushima¹, Kazutoshi Kobayashi¹, Jun Furuta¹ (1. Kyoto Inst. of Tech. (Japan))

11:30 〜 11:45

[J-4-03] Gate-controlled Gain Tuning of FDSOI-based 1T Pixel for In-Sensor White Balance

^○Jiaqi Li¹, Zheng Zhou¹, Guihai Yu¹, Haozhang Yang¹, Ruiqi Chen¹, Nan Tang¹, Peng Huang¹, Xiaoyan Liu¹, Jinfeng Kang¹ (1. School of Integrated Circuits, Peking Univ. (China))

11:45 〜 12:00

[J-4-04] A High-Accuracy Time-of-Flight Image Sensor Using Cascaded 4-Tap Demodulators and Dual-Phase Short-Pulse Modulation

^○HYEUN WOO KWEN¹, Hiroaki Nagae¹, Keita Yasutomi², Keiichiro Kagawa², Shoji Kawahito² (1. Graduate School of Integrated Sci. and Tech., Shizuoka Univ. (Japan), 2. Res. Inst. of Electronics, Shizuoka Univ. (Japan))

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