In-plane polarization domain of ferroelectric SnS thin film by PFM measurement

Satsuki Kitamura

doi:https://doi.org/10.7567/SSDM.2023.A-1-03

講演情報

Oral Presentation

08: Low Dimensional Devices and Materials

[A-1] Characterization I: Low Dimensional Devices and Materials

2023年9月6日(水) 14:00 〜 15:15 Room A (131+132, Bldg. 1)

Session Chairs: Takayuki Arie (Osaka Metropolitan Univ.), Yusuke Hoshi (Tokyo City Univ.)

14:45 〜 15:00

[A-1-03] In-plane polarization domain of ferroelectric SnS thin film by PFM measurement

^○Satsuki Kitamura¹, Ryo Nanae¹, Yih Ren Chang^1,2, Tomonori Nishimura¹, Kosuke Nagashio¹ (1. The Univ. of Tokyo (Japan), 2. RIKEN (Japan))

https://doi.org/10.7567/SSDM.2023.A-1-03

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講演情報

[A-1] Characterization I: Low Dimensional Devices and Materials

[A-1-03] In-plane polarization domain of ferroelectric SnS thin film by PFM measurement

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