Ultrafast spectroscopy is an important technical means for studying the carrier characteristics of semiconductor materials, widely used in research fields such as physical chemistry, information, materials, etc. In recent years, the research team has been committed to developing spectral measurement systems with spatial, temporal, and momentum resolution capabilities, studying the carrier characteristics in semiconductor material systems, and laying an important foundation for in-depth understanding and exploration of their optoelectronic properties and related devices. This report mainly reports on the progress of the research team in utilizing micro region ultrafast spectroscopy technology in semiconductor carrier mobility, electroacoustic coupling induced self-trapping luminescence, and edge state induced spectroscopy and carrier characteristics.