Mitigation of Carrier Trapping Effects on Carrier Lifetime Measurements with Continuous-Wave Laser Illumination for Metal Halide Perovskite Materials

NTUMBA LOBO

doi:https://doi.org/10.7567/SSDM.2023.C-2-01

4:00 PM - 4:15 PM

[C-2-01] Mitigation of Carrier Trapping Effects on Carrier Lifetime Measurements with Continuous-Wave Laser Illumination for Metal Halide Perovskite Materials

^○NTUMBA LOBO¹, Gebhard Josef Matt², Andres Osvet², Shreetu Shrestha², Levchuk Ievgen², Andrii Kanak³, Petro Fochuk³, Christoph J Brabec², Masashi Kato¹ (1. Nagoya Inst. of Tech (Japan), 2. Friedrich-Alexander Universität Erlangen-Nürnberg (Germany), 3. Yuriy Fedkovych Chernivtsi National Univ. (Ukraine))

https://doi.org/10.7567/SSDM.2023.C-2-01

Abstract password authentication.
PA password is required to view abstracts. You can find the password in the "Advance Program".The "Advance Program" is handed out at the registration desk to registered participants.

Presentation information

[C-2] Perovskite solar cells

[C-2-01] Mitigation of Carrier Trapping Effects on Carrier Lifetime Measurements with Continuous-Wave Laser Illumination for Metal Halide Perovskite Materials

Password