New module and sensor optic design to reduce petal flare in CMOS image sensor

Hye Yeon Park

doi:https://doi.org/10.7567/SSDM.2023.F-4-02

講演情報

Oral Presentation

01: Advanced CMOS: Material Science / Process Engineering / Device Technology

[F-4] Innovative Devices and Sensing Technology

2023年9月7日(木) 10:45 〜 11:45 Room F (224, Bldg. 2)

Session Chairs: Hidetoshi Oishi (Sony Semiconductor Solutions Corp.), Nobuyuki Mise (Hitachi High-Tech Corp.)

11:00 〜 11:15

[F-4-02] New module and sensor optic design to reduce petal flare in CMOS image sensor

^○Hye Yeon Park¹, Sang-In Bae¹, Yunki Lee¹, Tao Feng², Tong Cheng², Peide Li², Wei Zhang², Baotan Jiang², Jinmyoung Mok¹, Younggyu Jeong¹, Kyoungyong Choi¹, Bumsuk Kim¹, Jungchak Ahn¹ (1. Samsung Electronics (Korea), 2. vivo Communication Technology Co. Ltd (China))

https://doi.org/10.7567/SSDM.2023.F-4-02

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講演情報

[F-4] Innovative Devices and Sensing Technology

[F-4-02] New module and sensor optic design to reduce petal flare in CMOS image sensor

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