Optical Detection of Trace Amounts of Er Ions in Silicon-based Rare Earth Oxide Thin Film Waveguides

Shoichiro Yasui

doi:https://doi.org/10.7567/SSDM.2023.H-1-02

2:15 PM - 2:30 PM

[H-1-02] Optical Detection of Trace Amounts of Er Ions in Silicon-based Rare Earth Oxide Thin Film Waveguides

^○Shoichiro Yasui^1,2, Tomohiro Inaba¹, Kenichi Hitachi¹, Atsushi Ishizawa³, Reina Kaji², Takehiko Tawara⁴, Satoru Adachi², Xuejun Xu¹, Haruki Sanada¹ (1. NTT Basic Res. Lab., NTT Corp. (Japan), 2. Graduate School of Eng., Hokkaido Univ. (Japan), 3. College of Indus. Tech., Nihon Univ. (Japan), 4. College of Eng., Nihon Univ. (Japan))

https://doi.org/10.7567/SSDM.2023.H-1-02

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Presentation information

[H-1] Advanced Materials for Photonics

[H-1-02] Optical Detection of Trace Amounts of Er Ions in Silicon-based Rare Earth Oxide Thin Film Waveguides

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