2023 International Conference on Solid State Devices and Materials

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Oral Presentation

12: Advanced Circuits / Systems Interacting with Innovative Devices and Materials

[J-4] Circuit Reliability and Image Sensors

Thu. Sep 7, 2023 10:45 AM - 12:00 PM Room J (233, Bldg. 2)

Session Chairs: Takeshi Yoshida (Hiroshima Univ.), Keita Yasutomi (Shizuoka Univ.)

10:45 AM - 11:15 AM

[J-4-01 (Invited)] Circuit-level Insight into Reliability Issues of Si-based Semiconductor Chips

○Kazutoshi Kobayashi1 (1. Kyoto Inst. of Tech. (Japan))

https://doi.org/10.7567/SSDM.2023.J-4-01

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