Circuit-level Insight into Reliability Issues of Si-based Semiconductor Chips

Kazutoshi Kobayashi

doi:https://doi.org/10.7567/SSDM.2023.J-4-01

10:45 AM - 11:15 AM

[J-4-01 (Invited)] Circuit-level Insight into Reliability Issues of Si-based Semiconductor Chips

^○Kazutoshi Kobayashi¹ (1. Kyoto Inst. of Tech. (Japan))

https://doi.org/10.7567/SSDM.2023.J-4-01

This invited talk focus on circuit-level insight into reliability
issues. One topic is aging degradations to cause hard errors and the
second topic is soft errors that are one of temporal failures caused by
a radiation particle hit.

2023 International Conference on Solid State Devices and Materials

[J-4-01 (Invited)] Circuit-level Insight into Reliability Issues of Si-based Semiconductor Chips