Circuit-level Insight into Reliability Issues of Si-based Semiconductor Chips

Kazutoshi Kobayashi

doi:https://doi.org/10.7567/SSDM.2023.J-4-01

講演情報

Oral Presentation

12: Advanced Circuits / Systems Interacting with Innovative Devices and Materials

[J-4] Circuit Reliability and Image Sensors

2023年9月7日(木) 10:45 〜 12:00 Room J (233, Bldg. 2)

Session Chairs: Takeshi Yoshida (Hiroshima Univ.), Keita Yasutomi (Shizuoka Univ.)

10:45 〜 11:15

[J-4-01 (Invited)] Circuit-level Insight into Reliability Issues of Si-based Semiconductor Chips

^○Kazutoshi Kobayashi¹ (1. Kyoto Inst. of Tech. (Japan))

https://doi.org/10.7567/SSDM.2023.J-4-01

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講演情報

[J-4] Circuit Reliability and Image Sensors

[J-4-01 (Invited)] Circuit-level Insight into Reliability Issues of Si-based Semiconductor Chips

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