A Deep Look into the Endurance Degradation in Silicon Ferroelectric FET

Kai Ni

doi:https://doi.org/10.7567/SSDM.2023.K-1-01

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Oral Presentation

02: Advanced and Emerging Memories / New Applications

[K-1] Ferroelectric Devices

Wed. Sep 6, 2023 2:00 PM - 3:30 PM Room K (234, Bldg. 2)

Session Chairs: Halid Mulaosmanovic (GlobalFoundries., Germany), E Ray Hsieh (National Central Univ.)

2:00 PM - 2:30 PM

[K-1-01 (Invited)] A Deep Look into the Endurance Degradation in Silicon Ferroelectric FET

^○Kai Ni¹ (1. Univ. of Notre Dame (United States of America))

https://doi.org/10.7567/SSDM.2023.K-1-01

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Presentation information

[K-1] Ferroelectric Devices

[K-1-01 (Invited)] A Deep Look into the Endurance Degradation in Silicon Ferroelectric FET

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