Noise Event Injection Training to Mitigate Inference Accuracy Degradation due to Non-Idealities of Event-based Vision Sensor and Computation-in-Memory

Kazuhide Higuchi

doi:https://doi.org/10.7567/SSDM.2023.K-8-04

Presentation information

Oral Presentation

02: Advanced and Emerging Memories / New Applications

[K-8] In-Memory and Unconventional Computing 2

Fri. Sep 8, 2023 3:30 PM - 4:30 PM Room K (234, Bldg. 2)

Session Chairs: Kazuyuki Kouno (Nuvoton Technology Corporation Japan), Xu Bai (NanoBridge Semiconductor, Inc.)

4:15 PM - 4:30 PM

[K-8-04] Noise Event Injection Training to Mitigate Inference Accuracy Degradation due to Non-Idealities of Event-based Vision Sensor and Computation-in-Memory

Kazuhide Higuchi¹, ^○Yinghao Sun¹, Chihiro Matsui¹, Ken Takeuchi¹ (1. Univ. of Tokyo (Japan))

https://doi.org/10.7567/SSDM.2023.K-8-04

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Presentation information

[K-8] In-Memory and Unconventional Computing 2

[K-8-04] Noise Event Injection Training to Mitigate Inference Accuracy Degradation due to Non-Idealities of Event-based Vision Sensor and Computation-in-Memory

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