Noise Event Injection Training to Mitigate Inference Accuracy Degradation due to Non-Idealities of Event-based Vision Sensor and Computation-in-Memory

Kazuhide Higuchi

doi:https://doi.org/10.7567/SSDM.2023.K-8-04

講演情報

Oral Presentation

02: Advanced and Emerging Memories / New Applications

[K-8] In-Memory and Unconventional Computing 2

2023年9月8日(金) 15:30 〜 16:30 Room K (234, Bldg. 2)

Session Chairs: Kazuyuki Kouno (Nuvoton Technology Corporation Japan), Xu Bai (NanoBridge Semiconductor, Inc.)

16:15 〜 16:30

[K-8-04] Noise Event Injection Training to Mitigate Inference Accuracy Degradation due to Non-Idealities of Event-based Vision Sensor and Computation-in-Memory

Kazuhide Higuchi¹, ^○Yinghao Sun¹, Chihiro Matsui¹, Ken Takeuchi¹ (1. Univ. of Tokyo (Japan))

https://doi.org/10.7567/SSDM.2023.K-8-04

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講演情報

[K-8] In-Memory and Unconventional Computing 2

[K-8-04] Noise Event Injection Training to Mitigate Inference Accuracy Degradation due to Non-Idealities of Event-based Vision Sensor and Computation-in-Memory

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