2023 International Conference on Solid State Devices and Materials

Presentation information

Poster Session

02: Advanced and Emerging Memories / New Applications

[PS-2] 02: Advanced and Emerging Memories / New Applications

Thu. Sep 7, 2023 3:00 PM - 5:00 PM Shirotori Hall (Nagoya Congress Center)

[PS-2-08] The Study of Trap Evolution by Gate Leakage Current in Hf0.5Zr0.5O2 FeFET During Endurance Fatigue

Fengbin - Tian1, Xiaoqing - Sun1, Shuangshuang - Xu1, Songwei - Li1, Junshuai - Chai1, Hao - Xu1, Xiaolei - Wang1, Wenwu - Wang2 (1. Institute of Microelectronics of the Chinese Academy of Sciences (China), 2. Bureau of Major R&D Program Chinese Academy of Sciences (China))

https://doi.org/10.7567/SSDM.2023.PS-2-08

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