Investigation of Problems with Current Filament Simulation Model for Two-dimensional Multi-cell Structure in IGBTs

Takeshi Suwa

doi:https://doi.org/10.7567/SSDM.2023.PS-4-02

[PS-4-02] Investigation of Problems with Current Filament Simulation Model for Two-dimensional Multi-cell Structure in IGBTs

^○Takeshi Suwa¹, Kozo Kinoshita¹ (1. Toshiba Electronic Devices & Storage Corp. (Japan))

https://doi.org/10.7567/SSDM.2023.PS-4-02

Abstract password authentication.
A password is required to view abstracts. You can find the password in the "Advance Program".The "Advance Program" is handed out at the registration desk to registered participants.

講演情報

[PS-4] 04: Power / High‐speed Devices and Materials

[PS-4-02] Investigation of Problems with Current Filament Simulation Model for Two-dimensional Multi-cell Structure in IGBTs

パスワード