The 23rd Symposium on Sensing via Image Information

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Interactive session

[IS1] interactive session 1

Wed. Jun 7, 2017 2:45 PM - 4:30 PM IS ZONE (ANNEX HALL 2F)

2:45 PM - 4:30 PM

[IS1-22] Local Distribution Model Matching for Robust Defect Registration in SHIBO Surfaces

*Sheng XIANG1, Shun'ichi KANEKO1, Hirokazu ASANO2 (1. Hokkaido University, 2. HUAWEI TECHNOLOGIES JAPAN K.K.)

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