International Display Workshops General Incorporated Association

10:40 AM - 1:10 PM

[AMDp1-5] Transfer Characteristics of H2O2-Doped ZrInZnO Thin Film Transistors

*Sangmin Lee1, Bohyeon Jeon1, Byoungdeog Choi1 (1. Sungkyunkwan University (Korea))

TFTs, Solution-process, ZrInZnO, Hydrogen peroxide, Positive bias stress

https://doi.org/10.36463/idw.2019.0515

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