International Display Workshops General Incorporated Association

10:40 〜 13:10

[AMDp1-9] Fluorine-doped Indium Gallium Zinc Oxide Thin-Film Transistors Fabricated via Solution Process

*Donghee Choi1, Byoungdeog Choi1 (1. University of Sungkyunkwan (Korea))

IGZO TFTs, Fluorine, Doping effect, Solution process

https://doi.org/10.36463/idw.2019.0527

Fluorine-doped indium-gallium-zinc-oxide thin-film transistors were fabricated using a sol-gel process. The devices showed the enhanced electrical properties of Vth, saturation mobility, subthreshold swing and positive bias stress stability with an incorporation of the fluorine into the IGZO channel layer. This may be attributed the effect of fluorine doping. It generates the free electron by replacing the oxygen atoms and decreases the total trap states by occupying the oxygen vacancies.