International Display Workshops General Incorporated Association

Proceedings of the International Display Workshops Volume 26 (IDW '19)

Proceedings of the International Display Workshops Volume 26 (IDW '19)

2019年11月27日 〜 2019年11月29日
Sapporo Convention Center

10:40 〜 13:10

[FMCp3-2] Reliability Improvement of Narrow Down-border TED Product Based on LTPS-TFT LCD Technology

*Binbin Chen1, Zuoyin Li1, Haitao Duan1, Guozhao Chen1, Junyi Li1, Lei Wang1 (1. Xiamen Tianma Microelectronics Co., Ltd. (China))

TED, Metal corrosion, Potential difference, Full-screen-display

https://doi.org/10.36463/idw.2019.0704

We analyzed the failure route of metal corrosion and solved this issue by improving the coverage effect of passivation film on metal line. Otherwise, electrochemical corrosion mechanism was carried out to explain the failure mechanism and low potential difference metal was proposed to decrease the defective rate to 0.