An Aging Current Model for OLED Degradation

Qian CHEN

doi:https://doi.org/10.36463/idw.2019.0816

2:40 PM - 3:00 PM

[OLED1-4] An Aging Current Model for OLED Degradation

*Qian CHEN¹ (1. The Institute of Microelectronics of the Chinese Academy of Sciences (China))

Organic light-emitting diode, degradation, aging condition, current model

https://doi.org/10.36463/idw.2019.0816

This work presents a new aging current model of organic light-emitting diode (OLED). It can predict the OLED current with different stress time under some aging conditions, which can be used in related simulation software to describe the degradation of OLED.

Proceedings of the International Display Workshops Volume 26 (IDW '19)

[OLED1-4] An Aging Current Model for OLED Degradation