International Display Workshops Incorporated Association

10:40 AM - 1:10 PM

[OLEDp1-7] A Study of Encapsulation Structure for TFT Reliability in Top Emission OLED Display

*Jae Young Oh1, Seung Hee Nam1, Kwon-Shik Park1, SooYoung Yoon1, InByeong Kang1, Jae Kyeong Jeong2 (1. LG Display (Korea), 2. Hanyang University (Korea))

encapsulation, oxide, hydrogen, multilayer

Preventing hydrogen and water vapor from permeating through encapsulation layer plays an important role in TFT Reliability. To improve a blocking characteristic, encapsulation inorganic layers were studied. A SiNx and SiO2 multilayered inorganic deposition method for OLED has been developed to obtain a reliable performance.