International Display Workshops Incorporated Association

10:40 AM - 1:10 PM

[OLEDp1-7] A Study of Encapsulation Structure for TFT Reliability in Top Emission OLED Display

*Jae Young Oh1, Seung Hee Nam1, Kwon-Shik Park1, SooYoung Yoon1, InByeong Kang1, Jae Kyeong Jeong2 (1. LG Display (Korea), 2. Hanyang University (Korea))

encapsulation, oxide, hydrogen, multilayer

https://doi.org/10.36463/idw.2019.0910

Preventing hydrogen and water vapor from permeating through encapsulation layer plays an important role in TFT Reliability. To improve a blocking characteristic, encapsulation inorganic layers were studied. A SiNx and SiO2 multilayered inorganic deposition method for OLED has been developed to obtain a reliable performance.