International Display Workshops General Incorporated Association

Proceedings of the International Display Workshops Volume 27 (IDW '20)

Proceedings of the International Display Workshops Volume 27 (IDW '20)

2020年12月9日 〜 2020年12月11日
Virtual Conference

14:40 〜 15:00

[FMC4-1] Characterization of non-planar light sources using near field goniometric measurement method

*Kalil KÄLÄNTÄR1, Tomonori Tashiro2, Yasuki Yamauchi2 (1. Global Optical Solutions(Japan), 2. Yamagata University(Japan))

Non-planar light source , near field goniometric measurement, near field pattern, far field pattern, planar light source

https://doi.org/10.36463/idw.2020.0257

The metrology issues of non-planar light sources are studied using near field goniometric measurement method as a solution to depth-of-field issue. By means of the near field method, we have acquired the near field optical characteristics, and used to calculate the far field pattern by post processing.