A Study on the Radiation Hardness of Amorphous Oxide Thin-Film Transistors

3:10 PM - 3:30 PM

[AMD2-2(Invited)] A Study on the Radiation Hardness of Amorphous Oxide Thin-Film Transistors

*Hyuck-In Kwon¹, Min-Gyu Shin¹, Seong-Hyun Hwang¹, Kie Yatsu¹ (1.Chung-Ang University (Korea))

AOS TFT, proton irradiation, radiation tolerance

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