Scan Driver Circuit for Suppressing Degradation of Pull-Down Units Using Depletion-Mode a-IGZO TFTs

Yong-Hoo Hong, Eun Kyo Jung, Hwarim Im, Yong-Sang Kim

doi:https://doi.org/10.36463/idw.2021.0185

[AMDp1-2] Scan Driver Circuit for Suppressing Degradation of Pull-Down Units Using Depletion-Mode a-IGZO TFTs

*Yong-Hoo Hong¹, Eun Kyo Jung¹, Hwarim Im¹, Yong-Sang Kim¹ (1.Sungkyunkwan University (Korea))

Scan driver circuit, Depletion-mode, Capacitive coupling effect, a-IGZO TFTs, Pull-down units

https://doi.org/10.36463/idw.2021.0185

This paper proposes the scan driver circuit for depletion-mode a-IGZO TFTs using AC-driven CLK signals with the capacitive coupling effect for suppressing degradation of pull-down units. Simulation results show the proposed circuit generates stable output in the threshold voltage range from -2.0 V to +5.0 V.

Proceedings of the International Display Workshops Volume 28 (IDW '21)

[AMDp1-2] Scan Driver Circuit for Suppressing Degradation of Pull-Down Units Using Depletion-Mode a-IGZO TFTs