High Resolution Array Tester for Flat Panel Display Using Proximity Capacitance Image Sensor

Toshiro Yasuda, Kazuhisa Kobayashi, Yuichi Yamamoto, Hiroshi Hamori, Akinobu Teramoto, Rihito Kuroda, Shigetoshi Sugawa

doi:https://doi.org/10.36463/idw.2021.0258

6:10 PM - 6:30 PM

[FMC7/AIS9-4] High Resolution Array Tester for Flat Panel Display Using Proximity Capacitance Image Sensor

*Toshiro Yasuda¹, Kazuhisa Kobayashi¹, Yuichi Yamamoto¹, Hiroshi Hamori¹, Akinobu Teramoto², Rihito Kuroda³, Shigetoshi Sugawa³ (1.OHT Inc. (Japan), 2.Hiroshima University (Japan), 3.Tohoku University (Japan))

Array Tester, Defect Inspection, LCD, AMOLED, Proximity Capacitance Image Sensor

https://doi.org/10.36463/idw.2021.0258

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Proceedings of the International Display Workshops Volume 28 (IDW '21)

[FMC7/AIS9-4] High Resolution Array Tester for Flat Panel Display Using Proximity Capacitance Image Sensor

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