Breakthrough for test cost reduction on Micro LED device with electric-luminescence and electrical Test embedded solution

Hiroshi Kaga, Kotaro Hasegawa, Koji Miyauchi

doi:https://doi.org/10.36463/idw.2022.0277

10:40 AM - 11:00 AM

[FMC4-2] Breakthrough for test cost reduction on Micro LED device with electric-luminescence and electrical Test embedded solution

*Hiroshi Kaga¹, Kotaro Hasegawa¹, Koji Miyauchi¹ (1.ADVANTEST CORPORATION (Japan))

Micro-LED, mass production, test methodology, high throughput, electroluminescence

https://doi.org/10.36463/idw.2022.0277

To launch up Micro-LED display, the biggest challenge is cost reduction, With the urgent needs to reduce test costs, most critical issues is parallelizing electroluminescence (EL) test. In this paper, we propose super cost-effective test methods (PEMP^TM) embedding EL and electrical test and report its effectiveness and application results.

Proceedings of the International Display Workshops Volume 29 (IDW '22)

[FMC4-2] Breakthrough for test cost reduction on Micro LED device with electric-luminescence and electrical Test embedded solution