10:40 〜 11:00
[FMC4-2] Breakthrough for test cost reduction on Micro LED device with electric-luminescence and electrical Test embedded solution
Micro-LED, mass production, test methodology, high throughput, electroluminescence
To launch up Micro-LED display, the biggest challenge is cost reduction, With the urgent needs to reduce test costs, most critical issues is parallelizing electroluminescence (EL) test. In this paper, we propose super cost-effective test methods (PEMPTM) embedding EL and electrical test and report its effectiveness and application results.