Composite Mass-Transfer Method for Reducing Effect of Mura and Defects in mLED Wafer

Shin Yamada

doi:https://doi.org/10.36463/idw.2022.0280

11:00 〜 11:20

[FMC4-3] Composite Mass-Transfer Method for Reducing Effect of Mura and Defects in mLED Wafer

*Shin Yamada¹、Hiroaki Ito¹、Yohei Sato¹、Toshihiko Fujiwara¹、Kunio Imaizumi¹、Takeshi Yokoyama¹、Noriyuki Yamawaki¹、Nobuyuki Hasegawa¹、Tokuro Ozawa¹、Shinji Yuda¹ (1.Kyocera Corporation (Japan))

micro-LED display, mass-transfer, redundant pixel, stamp, yield

https://doi.org/10.36463/idw.2022.0280

Defects and mura in micro-LED wafers are serious issues that increase the cost of micro-LED displays. We developed a composite mass-transfer method to produce micro-LED displays even when some defects and mura remain in a micro-LED wafer.

Proceedings of the International Display Workshops Volume 29 (IDW '22)

[FMC4-3] Composite Mass-Transfer Method for Reducing Effect of Mura and Defects in mLED Wafer