Composite Mass-Transfer Method for Reducing Effect of Mura and Defects in mLED Wafer

Shin Yamada, Hiroaki Ito, Yohei Sato, Toshihiko Fujiwara, Kunio Imaizumi, Takeshi Yokoyama, Noriyuki Yamawaki, Nobuyuki Hasegawa, Tokuro Ozawa, Shinji Yuda

doi:https://doi.org/10.36463/idw.2022.0280

11:00 AM - 11:20 AM

[FMC4-3] Composite Mass-Transfer Method for Reducing Effect of Mura and Defects in mLED Wafer

*Shin Yamada¹, Hiroaki Ito¹, Yohei Sato¹, Toshihiko Fujiwara¹, Kunio Imaizumi¹, Takeshi Yokoyama¹, Noriyuki Yamawaki¹, Nobuyuki Hasegawa¹, Tokuro Ozawa¹, Shinji Yuda¹ (1.Kyocera Corporation (Japan))

micro-LED display, mass-transfer, redundant pixel, stamp, yield

https://doi.org/10.36463/idw.2022.0280

Defects and mura in micro-LED wafers are serious issues that increase the cost of micro-LED displays. We developed a composite mass-transfer method to produce micro-LED displays even when some defects and mura remain in a micro-LED wafer.

Proceedings of the International Display Workshops Volume 29 (IDW '22)

[FMC4-3] Composite Mass-Transfer Method for Reducing Effect of Mura and Defects in mLED Wafer