International Display Workshops General Incorporated Association

11:00 〜 11:20

[FMC4-3] Composite Mass-Transfer Method for Reducing Effect of Mura and Defects in mLED Wafer

*Shin Yamada1、Hiroaki Ito1、Yohei Sato1、Toshihiko Fujiwara1、Kunio Imaizumi1、Takeshi Yokoyama1、Noriyuki Yamawaki1、Nobuyuki Hasegawa1、Tokuro Ozawa1、Shinji Yuda1 (1.Kyocera Corporation (Japan))

micro-LED display, mass-transfer, redundant pixel, stamp, yield

https://doi.org/10.36463/idw.2022.0280

Defects and mura in micro-LED wafers are serious issues that increase the cost of micro-LED displays. We developed a composite mass-transfer method to produce micro-LED displays even when some defects and mura remain in a micro-LED wafer.