[AMDp1-4] Emission Gate Driver Generating Reliable and Adjustable Scan Signals for Micro-LED Displays
emission gate driver, micro-LED display, low-temperature polycrystalline silicon thin-film transistor
This work proposes an emission gate driver to generate adjustable scan signals. The reliability of emission scan signals can be enhanced by increasing the driving capability of TFTs and the stabilization period. Therefore, the proposed gate driver is feasible for micro-LED displays.