International Display Workshops General Incorporated Association

Proceedings of the International Display Workshops Volume 30 (IDW '23)

Proceedings of the International Display Workshops Volume 30 (IDW '23)

2023年12月6日 〜 2023年12月8日
TOKI MESSE Niigata Convention Center

[AMDp1-4] Emission Gate Driver Generating Reliable and Adjustable Scan Signals for Micro-LED Displays

*Cheng-Han Ke1, Yi-Chen Huang1, Ting-En Wei1, Ming-Yang Deng2, Chih-Lung Lin1 (1. National Cheng Kung University (Taiwan), 2. AUO Corporation (Taiwan))

emission gate driver, micro-LED display, low-temperature polycrystalline silicon thin-film transistor

https://doi.org/10.36463/idw.2023.0241

This work proposes an emission gate driver to generate adjustable scan signals. The reliability of emission scan signals can be enhanced by increasing the driving capability of TFTs and the stabilization period. Therefore, the proposed gate driver is feasible for micro-LED displays.