International Display Workshops General Incorporated Association

Proceedings of the International Display Workshops Volume 30 (IDW '23)

Proceedings of the International Display Workshops Volume 30 (IDW '23)

2023年12月6日 〜 2023年12月8日
TOKI MESSE Niigata Convention Center

11:50 〜 12:10

[DXR1-4 (Invited)] Evaluation of Crystal Quality of TlBr Semiconductor Detector

*Kenichi Watanabe1, Sota Hasegawa1, Yusuke Sugai1, Mitsuhiro Nogami2, Keitaro Hitomi2 (1. Kyushu University (Japan), 2. Tohoku University (Japan))

Semiconductor detector, TlBr, Neutron diffraction

https://doi.org/10.36463/idw.2023.1428

Thallium bromide (TlBr) is a semiconductor attractive for gamma-ray detectors and imagers. In order to realize a large size TlBr detectors, we should discuss crystal quality. As the crystal quality evaluation methods, we applied neutron Bragg-dip imaging, which is based on the neutron diffraction technique.