Evaluation of Crystal Quality of TlBr Semiconductor Detector

11:50 AM - 12:10 PM

[DXR1-4 (Invited)] Evaluation of Crystal Quality of TlBr Semiconductor Detector

*Kenichi Watanabe¹, Sota Hasegawa¹, Yusuke Sugai¹, Mitsuhiro Nogami², Keitaro Hitomi² (1. Kyushu University (Japan), 2. Tohoku University (Japan))

Semiconductor detector, TlBr, Neutron diffraction

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