International Display Workshops General Incorporated Association

[FMCp3-9L] Novel Inspection Method to Improve Manufacturing Yield of Micro LED

*Yoshiyuki Yokoyama1, Kota Morishima1, Kenichiro Ikemura1, Tomonori Nakamura1, Kazuya Iguchi1 (1. Hamamatsu Photonics K.K. (Japan))

lambda capture technology, photoluminescence, electroluminescence

https://doi.org/10.36463/idw.2023.0503

Novel photoluminescence wavelength measurement method called lambda capture technique was verified by measuring an actual Micro LED sample. By comparison with the conventional electroluminescence technique, we confirmed reliability of the novel measurement technique. By applying this inspection technology to manufacturing industry, manufacturing yield of Micro LED would be greatly improved.