International Display Workshops General Incorporated Association

13:50 〜 14:10

[OLED7-2 (Invited)] Device Physics and Degradation of OLEDs Investigated by Advanced Characterization

Stefano Sem1, Sandra Jenatsch1, *Simon Züfle1, Arno Gadola1, Daniel Hudson2, Balthasar Blülle1, Christof Pflumm2, Beat Ruhstaller1,3 (1. Fluxim AG (Switzerland), 2. Merck KGaA (Germany), 3. Zurich University of Applied Sciences (Switzerland))

OLED, accelerated lifetime test, stability, TADF, degradation mechanisms

https://doi.org/10.36463/idw.2023.0602

The operational stability is a key factor in the improvement of OLEDs. Here we present accelerated lifetime studies (ALT) for a blue TADF OLED and demonstrate the successful determination of the scaling parameters. Moreover, we study the microscopic degradation mechanisms using advanced in-situ electrical characterization methods.