13:50 〜 14:10
[OLED7-2 (Invited)] Device Physics and Degradation of OLEDs Investigated by Advanced Characterization
OLED, accelerated lifetime test, stability, TADF, degradation mechanisms
The operational stability is a key factor in the improvement of OLEDs. Here we present accelerated lifetime studies (ALT) for a blue TADF OLED and demonstrate the successful determination of the scaling parameters. Moreover, we study the microscopic degradation mechanisms using advanced in-situ electrical characterization methods.