Inherent Memory Effects in ZnS:Mn Thin-Film EL Devices

M. Takeda; Y. Kakihara; M. Yoshida; J. Kawaguchi; H. Kishishita; Y. Nakata Y. Yamauchi; T. Inoguchi; S. Mito

doi:https://doi.org/10.7567/SSDM.1974.A3-4

1974 Conference on Solid State Devices

Sep 2, 1974 - Sep 3, 1974
The Tokyo Chamber of Commerce and Industry, Tokyo, Japan

[A3-4] Inherent Memory Effects in ZnS:Mn Thin-Film EL Devices

M. Takeda, Y. Kakihara, M. Yoshida, J. Kawaguchi, H. Kishishita, Y. Nakata Y. Yamauchi, T. Inoguchi, S. Mito (1.Central Research Lab., SHARP Corporation)

https://doi.org/10.7567/SSDM.1974.A3-4

▲