[A3-4] Inherent Memory Effects in ZnS:Mn Thin-Film EL Devices

M. Takeda、Y. Kakihara、M. Yoshida、J. Kawaguchi、H. Kishishita、Y. Nakata Y. Yamauchi、T. Inoguchi、S. Mito (1.Central Research Lab., SHARP Corporation)

https://doi.org/10.7567/SSDM.1974.A3-4