[A-7-1] THIN FILM EVALUATION TECHNIQUES FOR THE ESFI SOS TECHNOLOGY M. Druminski, Ch. Kuhl, E. Preuss, F. Schwidefsky, H. Splittgerber, D. Takacs (1.Siemens AG, Research Laboratories) https://doi.org/10.7567/SSDM.1975.A-7-1