Contents of Non-Radiative Deep Levels and its Relation to Crystallographic Quality

J. Nishizawa; Y. Okuno; K. Nishidori; M. Fujii

doi:https://doi.org/10.7567/SSDM.1977.B-1-2

1977 Conference on Solid State Devices

Aug 30, 1977 - Aug 31, 1977
The Tokyo Chamber of Commerce and Industry, Tokyo, Japan

[B-1-2] Contents of Non-Radiative Deep Levels and its Relation to Crystallographic Quality

J. Nishizawa, Y. Okuno, K. Nishidori, M. Fujii (1.Research Institute of Electrical Communication, Tohoku University, 2.Semiconductor Research Institute)

https://doi.org/10.7567/SSDM.1977.B-1-2

▲