[B-6-3] Life Test and Degradation Modes of Continuously Operated NEA GaP Cold-Cathode H. Kan, T. Nakamura, H. Katsuno, M. Hagino, T. Sukegawa (1.Research Institute of Electronics, Shizuoka University) https://doi.org/10.7567/SSDM.1978.B-6-3