[A-3-5] Diffusion Length Measurement Using Dynamic MOS RAM

M. Kumanoya, M. Taniguchi, M. Yamada, T. Kobayashi, Y. Nagayama, T. Nakano (1.LSI Research and Development Laboratory, Mitsubishi Electric Corporation)

https://doi.org/10.7567/SSDM.1982.A-3-5