[B-2-6] GaP Green LED Degradation Associated with Nonstoichiometric Layer Created during Electrode Formation Process

A. Yahata, M. Kawachi, Y. Iizuka, T. Beppu (1.Research and Development Center, Optoelectronic Semiconductor Engineering Dept., Toshiba Corp.)

https://doi.org/10.7567/SSDM.1982.B-2-6