[B-2-6] GaP Green LED Degradation Associated with Nonstoichiometric Layer Created during Electrode Formation Process

A. Yahata、M. Kawachi、Y. Iizuka、T. Beppu (1.Research and Development Center, Optoelectronic Semiconductor Engineering Dept., Toshiba Corp.)

https://doi.org/10.7567/SSDM.1982.B-2-6