Raman Scattering Measurement of the Free-Carrier Concentration in AlxGa1-xAs

1983 Conference on Solid State Devices and Materials

Aug 30, 1983 - Sep 1, 1983
The Tokyo Chamber of Commerce and Industry, Tokyo, Japan

T. Yuasa, S. Naritsuka, M. Mannoh, K. Shinozaki, K. Yamanaka, Y. Nomura, M. Mihara, M. Ishii (1.Optoelectronics Joint Research Laboratory)