The Japan Society of Applied Physics

[B-4-4] Crystallographic Analysis of Thin Film Surfaces Using Micro-Probe Reflexion High-Energy Electron Diffraction

Masakazu Ichikawa, Takahisa Doi, Kazunobu Hayakawa (1.Central Research Laboratory, Hitachi Ltd.)

https://doi.org/10.7567/SSDM.1984.B-4-4